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The Thermo Scientific Talos F200X G2 is a cutting-edge Scanning Transmission Electron Microscope (S/TEM) that features an X-FEG high-brightness electron source operating at 200 kV, ensuring exceptional imaging quality. This instrument delivers impressive resolution, with High-Resolution Transmission Electron Microscopy (HRTEM) at 0.10 nm and High-Resolution Scanning Transmission Electron Microscopy (HRSTEM) at 0.16 nm, allowing for the precise analysis of nano-materials. Users benefit from rapid data acquisition through its 4k x 4k Ceta 16M camera, achieving frame rates of up to 40 frames per second for full frames and 300 frames per second for reduced sizes, significantly enhancing workflow efficiency. The integrated Super-X Silicon Drift Detector (SDD) system offers high-resolution Energy Dispersive Spectroscopy (EDS) capabilities with a collection solid angle of 0.7 steradians, enabling comprehensive 3D chemical characterization. Overall, the Talos F200X G2 empowers researchers with automated features, such as Align Genie and AutoSTEM, which optimize image quality and operational ease for advanced material studies.
Features | Specifications |
---|---|
Model | Talos F200X G2 |
Type | Scanning Transmission Electron Microscope (S/TEM) |
Electron Source | X-FEG high-brightness electron source |
Acceleration Voltage | 200 kV |
Resolution HRTEM | 0.10 nm |
Resolution HRSTEM | 0.16 nm |
Camera | 4k x 4k Ceta 16M |
Frame Rate Imaging | 40 fps (full frames), 300 fps (reduced frame size) |
EDS System | Super-X SDD detection system with 4 large area crystals |
EDS Collection Solid Angle | 0.7 steradians |
Detector | EMPAD pixelated detector |
Detectors Available | Segmented Panther STEM detector and HAADF detector |
Automated Software | Align Genie, AutoSTEM |
Lens System | Constant-Power X-TWIN lens |
Stage | Computerized 5-axes Piezo enhanced stage |
Energy Resolution | ≤136 eV for Mn-Kα |
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