Select Instruments

Cameca - LEAP 5000 HR
The Cameca LEAP 5000 HR is an advanced atom probe tomography tool that provides detailed atom-by-atom reconstruction of materials, facilitating 3D chemical analysis at the nanometer scale. It features a voltage pulsing frequency of up to 250 kHz and can operate with a laser pulsing frequency between 50 to 500 kHz. The tool's capability to analyze phase transformations and semiconductor properties, particularly dopants and quantum structures, enables researchers to gain deeper insights into material behaviors. With a detection efficiency of approximately 52% in reflectron configuration and a spot size less than 3 micrometers, it ensures high-resolution data collection. Overall, the LEAP 5000 HR empowers users by enhancing their ability to investigate material properties with unparalleled precision, significantly advancing research in materials science and engineering applications.
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Shimadzu - DTA-50
The Shimadzu Differential Thermal Analyzer (DTA-50) is a high-performance thermal analysis instrument designed to measure thermal transitions such as glass transitions, crystallization, and phase changes in materials across a broad temperature range of ambient to 1500°C, with calibrated accuracy up to 1100°C. Featuring a dual-pan system and a measurement range of ±0.2 to ±1000 µV, it provides precise calorimetric data for both solid and liquid samples in quantities as small as 5–10 mg. Its programmable heating rates from 0.1 to 50.0°C/min and integrated atmosphere control with a gas flowmeter ensure versatile and controlled experimental conditions. With rapid atmosphere purging and high-temperature Differential Scanning Calorimetry (DSC) capabilities, it delivers fast and sensitive results while accommodating challenging materials that exceed the operating limits of standard DSC systems. Compact yet powerful, the DTA-50 enables researchers and engineers to gain detailed insights into material properties, enhancing the accuracy and efficiency of thermal analysis workflows.
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Positron Annihilation Spectroscopy
Positron Annihilation Spectroscopy (PAS) utilizes a mono-energetic variable energy beam ranging from 0.01 keV to 70 keV to detect vacancy and vacancy-related defects in materials. This advanced technique operates with high sensitivity, enabling the detection of defects at concentrations as low as 10^-7 per atom, and provides depth resolution of 10 to 20 micrometers, depending on material density. Two high purity Ge detectors facilitate measurements, delivering an energy resolution of 1.4 keV at 511 keV and allowing for Doppler Broadening and Positronium detection. With a capability to analyze samples at temperatures ranging from 10 K to 1300 K, PAS accommodates various experimental setups, including in situ tests influenced by temperature, illumination, and electric fields. Users can benefit from detailed insight into material properties, fostering improved material design and defect characterization for applications across semiconductor and photovoltaic technologies.
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Keyence - EA 300 Series LIBS
The Keyence EA 300 Series is a sophisticated Laser-Induced Breakdown Spectroscopy (LIBS) tool designed for elemental analysis that requires no sample preparation, thereby saving users time and resources. It provides fast measurements, typically completed within a few seconds, which enhances workflow efficiency and productivity in laboratories. With capabilities for mapping and depth profile analysis at approximately 10 µm resolution, it delivers detailed insights into material composition and structure. The instrument operates using a laser wavelength of 355 nm and accommodates samples up to 250 mm in size, making it suitable for a wide range of materials including solids, liquids, and powders. Ultimately, this tool not only accurately identifies elements from hydrogen to uranium but also quantifies trace and major elements, significantly aiding in material characterization and quality control processes.
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Thermo Fisher - Nova 200 Nanolab FIB
The Thermo Fisher Nova 200 Nanolab Scanning Electron Microscope/Focussed Ion Beam (SEM/FIB) offers advanced capabilities for surface and cross-section imaging, enabling users to analyze topology, chemistry, and phase contrast with high precision. This instrument boasts an accelerating voltage range of 0.2 to 30 kV for electrons and ions, translating to unparalleled flexibility for various sample types and imaging needs. With a remarkable electron resolution of 1.1 nm at 15 kV and ion resolution of 7 nm at 30 kV, it allows researchers to observe minute details in their samples, essential for cutting-edge material characterization. Additionally, the SEM/FIB is equipped with gas injectors and micromanipulators, empowering users to perform intricate specimen preparation techniques such as Transmission Electron Microscopy (TEM) and Atom Probe Tomography (APT). This fusion of high-resolution imaging and specimen preparation capabilities significantly enhances the user experience, enabling groundbreaking research and development across multiple scientific disciplines.
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Instron - 68FM-300
The Instron 68FM-300 is a versatile universal testing system capable of conducting various tests, including tensile, compression, flex, peel, puncture, friction, and shear. With a force capacity of up to 300 kN (67,440 lbf), it provides precise and reliable measurements for high-demand testing applications. Its accuracy, within 0.5% down to 1/1000th of load cell capacity, ensures precision in performance across a wide range of materials. The system offers a position control resolution of 1.1 nm (0.04 µin) and a data acquisition rate of up to 5 kHz, enabling detailed, high-speed analysis of material behavior. Additionally, the 68FM-300 supports continuous cyclic, creep, and relaxation testing for up to 10 days, making it ideal for long-duration material analysis and ensuring consistent data collection over extended periods.
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Perkin Elmer - Optima 8300 ICP-OES
The PerkinElmer Optima 8300 is an advanced Inductively Coupled Plasma Optical Emission Spectroscopy (ICP-OES) system featuring dual-view capability for versatile plasma viewing. With a spectral range of 163 to 782 nm and a resolution as fine as 0.006 nm, it offers superior detection limits, enabling precise and accurate elemental analysis across varying samples. The system's integrated software controls plasma ignition and operates the dual solid-state detectors, significantly reducing analysis time to just 50 seconds per pixel while maintaining a readout noise of approximately 13 electrons RMS. Users benefit from exceptional power efficiency, with an adjustable solid-state RF generator achieving over 81% efficiency and adaptable power settings from 750 to 1500 watts. This combination of features not only enhances analytical throughput but also ensures reliable and reproducible performance in diverse laboratory environments.
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FEI - Helios 600i Dual Beam FIB
The FEI Helios 600i Dual Beam SEM/FIB is a sophisticated workstation that combines scanning electron microscopy (SEM) with focused ion beam (FIB) capabilities to achieve ultra-high resolution imaging and precise milling. With a resolution of 1.4 nm at 1 kV and a beam current of up to 65 nA, it enables rapid and detailed nanoscale prototyping and machining. Users benefit from advanced detection technologies, including a high-performance Ion Conversion and Electron detector, ensuring excellent imaging quality and accurate material analysis. The system’s unique features, such as a retractable directional backscattered detector and beam deceleration mode, facilitate versatile sample handling at low landing energies, enhancing sample integrity. Overall, the Helios 600i is designed to meet the rigorous demands of nanotechnology research and development, providing users with powerful tools for innovation and discovery.
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Zeiss - LSM 7 Live
The Zeiss LSM 7 Live is a high-performance confocal fluorescence microscope that operates at an impressive speed of 120 frames per second while capturing images at a resolution of 512 x 512 pixels. This rapid imaging capability allows for the analysis of high-speed biological processes, providing time resolutions as low as a few microseconds, which is essential for observing dynamic cellular events. Equipped with a motorized X,Y stage and an advanced motorized Z stage, the microscope ensures precision in positioning and depth variation during imaging. Its Z-piezo focus objective collar enables fast z-stack acquisition over a 200 μm range in 15 nm steps, facilitating detailed three-dimensional imaging. As a result, researchers benefit from enhanced accuracy and efficiency in their experiments, leading to more actionable insights in various fields of study.
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Hysitron - TI-950 TriboIndenter
The Hysitron TI-950 TriboIndenter is an advanced automated tool designed for nanomechanical characterization, featuring a vertical travel of 50 mm and an indentation depth greater than 5 µm. With a thermal drift of only 0.05 nm/s, it offers exceptional measurement sensitivity and accuracy, making it reliable for precise nanoindentation processes. Users benefit from a maximum normal load capacity of 10 mN and a lateral load of 2 mN, enabling versatile applications across various sample types, including 12-inch wafers and embedded samples. The high load transducer can exert a maximum lateral force of 5 N, allowing for extensive scratching capabilities up to 25 mm, which is essential for analyzing material properties such as hardness and delamination resistance. Enhanced with a 20X optical objective and a maximum field of view of 772 x 588 µm, the TI-950 facilitates comprehensive surface analysis and rapid data collection, accelerating research and development in material sciences.
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Neaspec - Nano IR-NIM AFM
The Neaspec Nano IR-NIM AFM employs advanced Fourier-transform infrared (FTIR) and scattering scanning near-field optical microscopy (SNOM) techniques to deliver exceptional imaging capabilities. It operates within the mid-infrared range of 700 to 2200 cm -1, enabling users to achieve a resolution of just a few tens of nanometers. With a spatial lateral resolution of 20 nm, this tool allows for detailed chemical and topographic characterization of samples in a measurement area of approximately 100 x 100 µm². The mid-IR imaging module enhances functionality by permitting images to be captured at specific wavelengths, highlighting areas of absorption on the sample. Overall, the Nano IR-NIM AFM provides researchers with the ability to conduct high-resolution chemical analysis, facilitating advanced studies in materials science and nanotechnology.
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TA Instruments - Discovery 2500 DSC
The DSC 2500 is a Differential Scanning Calorimeter (DSC) designed to measure heat effects associated with phase transitions and chemical reactions. It offers a baseline flatness of ≤5 μW and repeatability of 10 μW over a temperature range from 180°C to 725°C, ensuring highly accurate and consistent data. With a temperature accuracy of ±0.025°C and precision of ±0.005°C, users can rely on precise thermal measurements for analyzing material properties. The tool provides enthalpy precision of ±0.04%, enabling detailed evaluation of heat flow associated with phase changes, crystallization, and cure kinetics. These capabilities allow researchers to confidently perform thermal analysis on samples, enhancing their understanding of material behaviors under controlled temperature conditions.
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Asylum Research - Cypher S AFM
The Asylum Research Cypher S is a state-of-the-art Atomic Force Microscope (AFM) that offers a maximum lateral scan size of 30 µm x 30 µm and a maximum vertical range of 5 µm, enabling detailed imaging of samples in either air or liquid environments. With exceptionally low noise levels, it ensures high-resolution measurements, making it ideal for sensitive applications. The instrument is equipped with various advanced scanning modes and accessories, including AM-FM viscoelastic mapping and Contact Resonance viscoelastic mapping, which enhance its versatility for different research needs. A standout feature is the Fast Force Mapping upgrade, which allows users to acquire force curves in just minutes rather than hours, significantly improving data collection efficiency. Ultimately, this combination of high performance and quick data acquisition enhances research capabilities, enabling users to explore previously unscannable soft or adhesive samples with precision.
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Thermo Fisher - Helios 650 Nanolab FIB
The Thermo Fisher Helios 650 is a state-of-the-art Focused Ion Beam (FIB) tool designed for advanced materials characterization. Operating at a voltage range of 5-30 kV and a beam current from 1 picoampere (pA) to 100 nanoamperes (nA), it offers versatility for a wide range of applications. With a remarkable resolution of 5 nanometers at 30 kV, users can achieve precise imaging and analysis of nanoscale structures. The automated multi-axis stage control enhances usability, allowing for intricate sample manipulation and easier navigation. Equipped with a gas injection system for in-situ deposition, it combines high-resolution imaging capabilities with the ability to modify and fabricate nanostructures on samples up to 100 mm in size and 10 mm in thickness, making it an essential tool for researchers and engineers in the field.
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Thermo Scientific - Talos F200X G2 STEM
The Thermo Scientific Talos F200X G2 is a cutting-edge Scanning Transmission Electron Microscope (S/TEM) that features an X-FEG high-brightness electron source operating at 200 kV, ensuring exceptional imaging quality. This instrument delivers impressive resolution, with High-Resolution Transmission Electron Microscopy (HRTEM) at 0.10 nm and High-Resolution Scanning Transmission Electron Microscopy (HRSTEM) at 0.16 nm, allowing for the precise analysis of nano-materials. Users benefit from rapid data acquisition through its 4k x 4k Ceta 16M camera, achieving frame rates of up to 40 frames per second for full frames and 300 frames per second for reduced sizes, significantly enhancing workflow efficiency. The integrated Super-X Silicon Drift Detector (SDD) system offers high-resolution Energy Dispersive Spectroscopy (EDS) capabilities with a collection solid angle of 0.7 steradians, enabling comprehensive 3D chemical characterization. Overall, the Talos F200X G2 empowers researchers with automated features, such as Align Genie and AutoSTEM, which optimize image quality and operational ease for advanced material studies.
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Kratos - Supra+ XPS
The Kratos Supra+ XPS is a sophisticated photoelectron spectrometer featuring hemispherical and spherical mirror energy analyzers complemented by a high-sensitivity Delay Line Detector (DLD). With an automated dual anode Al Ka/Ag La monochromatic X-ray source operating at 1486.7/2984.2 eV, this tool facilitates precise surface analysis. It supports a maximum sample size of 34 mm x 75 mm and thickness of up to 7 mm, allowing flexibility in sample handling. Users can choose between large area (700 x 300 µm²) and small spot modes (ranging from 110 µm to 15 µm diameters) for diverse spectroscopy needs, achieving a spatial resolution down to 1 µm. Additional features including angle-resolved XPS analysis and a robust gas cluster ion source enhance the tool's versatility, making it ideal for advanced research requiring high-resolution imaging and precise element analysis.
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Tescan - MIRA3 SEM (with Picoindenter)
The Tescan MIRA3 SEM (Scanning Electron Microscope) with Picoindenter offers remarkable features designed for advanced materials analysis, including a maximum accelerating voltage of 30kV and exceptional resolution down to 1.2nm. This instrument is equipped with various detectors, including Secondary Electron Imaging and Backscattered Electron Detection, which facilitate versatile imaging capabilities across different modes, catering to high-resolution and large field-of-view requirements. Users benefit from the integrated Picoindenter, which enables precise nanomechanical testing with load capabilities of up to 500mN and an impressive maximum displacement of 150µm. The spacious sample chamber, with a maximum specimen height of 145mm, allows for the examination of larger samples, broadening testing possibilities across multiple applications in materials science. Overall, the combination of high-resolution imaging and detailed mechanical characterization makes the MIRA3 SEM an invaluable tool for researchers seeking in-depth insights into material properties and behaviors.
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TA Instruments - Q50 TGA
The Q50 Thermogravimetric Analysis (TGA) system is designed to precisely measure weight changes in a material as it undergoes thermal changes, with a maximum sample weight of 1 gram and a sensitivity of 0.1 micrograms. Its resistance wound furnace allows for a wide temperature range from ambient to 1000 °C, enabling controlled heating rates from 0.1 to 100 °C/min. The system ensures high accuracy with an isothermal temperature accuracy of +/- 1 °C, while the furnace cooling capability rapidly reduces temperature from 1000 to 50 °C in under 12 minutes. Its digital mass flow control and gas switching capability ensure precise metering of purge and reactive gases, improving measurement consistency. By incorporating Advantage software for automatic control and Universal Analysis software for in-depth data interpretation, the Q50 enhances experimental efficiency and data quality, making it ideal for users seeking reliable thermal stability and composition analysis.
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TA Instruments - Q800 DMA
The Q800 Dynamic Mechanical Analysis (DMA) offers a wide range of features for precise measurement of mechanical properties, including a maximum force of 18 N and a force resolution as fine as 0.00001 N. It provides modulus measurements across a range from 103 to 3x1012 Pa, with an accuracy of ±1%, and can analyze viscoelastic properties over a frequency range of 0.01 to 200 Hz. The instrument's temperature range spans from -150°C to 600°C, allowing for versatile testing conditions, while its dynamic sample deformation range covers ±0.5 to 10,000 µm. Its strain resolution of 1 nanometer and Tan δ sensitivity of 0.0001 offer highly detailed and precise data. The Q800’s software suite, including Advantage and Universal Analysis, streamlines automatic experimental control and comprehensive data analysis, making it ideal for users seeking detailed mechanical characterization across a wide range of materials and testing conditions.
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Thermo Fisher - Nicolet iS50 FTIR
The Thermo Fisher Nicolet iS50 is a versatile Fourier Transform Infrared Spectrophotometer (FTIR) that excels in measuring various methods such as transmission, specular and diffuse reflection, as well as attenuated total reflection (ATR) within a wavelength range of 400 cm -1 to 7800 cm -1. The inclusion of an FT-Raman module with a 500 mW 1064 nm excitation source and InGaAs detector enhances its capability to analyze bulk, powder, and liquid samples while significantly reducing fluorescence interference in Raman spectra. With accessories like an XYZ sampling stage, multiple sampling trays (9 and 48 well), and a built-in USB video camera, this tool offers ease of use and efficiency in analysis. The built-in diamond ATR enables fast analysis with minimal setup time, making it ideal for diverse samples without the need for extensive preparation. Additionally, its ability to accommodate solid sample sizes ranging from 40 mm x 5 mm to 140 mm x 200 mm and liquid volumes between 0.1 ml and 0.5 ml provides users with flexible options for various experimental requirements.
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PANalytical - X’pert MRD System
The PANalytical X’pert MRD system #2 features a theta/2theta vertical four-circle system that includes phi and psi rotations along with x, y, and z sample translations. This advanced configuration allows for precise measurements with a high-speed PIXcel line detector that has a pixel size of 55 microns, providing detailed and accurate data for various applications. Users can conduct general thin film and bulk phase analysis, as well as stress and texture analysis, making it suitable for a wide range of materials. With its ability to operate at high temperatures of up to 900°C and utilize various optical configurations, it greatly enhances the efficiency of analysis processes, delivering medium resolution, high-intensity results. The Micro X-ray Diffraction (XRD) setup offers spatial resolution between 100 and 400 microns, making it an indispensable tool for investigating the crystallographic properties of ultra-thin films.
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Bruker - D8 XRD
The Bruker D8 Advance is a sophisticated X-ray diffraction (XRD) and reflectivity (XRR) system that incorporates a vertical theta/theta goniometer and a high-resolution Eigher2 R 500 K detector with 1,030 x 514 pixels and a pixel size of 75 microns. This tool excels in flexibility, offering multiple configurations, including line focus Bragg Brentano and high-resolution options, making it suitable for a wide range of applications such as powder XRD, thin film analysis, and texture studies. Users benefit from its high photon capacity of 2.5x10^8 photons per second per mm², ensuring rapid data acquisition even for complex samples. Additionally, its ability to operate at temperatures up to 1200 °C with a four-circle sample stage enhances its utility for in situ experiments. Ultimately, the D8 Advance enables precise material characterizations, supports advanced research needs, and streamlines the analysis process with powerful software tools like EVA and TOPAS.
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Hitachi - S4800 SEM
The Hitachi S-4800 Scanning Electron Microscope (SEM) delivers impressive high-resolution low voltage imaging with resolutions of 1.0 nm at 15 kV and 1.4 nm at 1 kV. This advanced imaging capability allows users to explore intricate surface details with a maximum magnification range from 100x to an astounding 800,000x, making it ideal for both low and high magnification studies. The SEM is equipped with an electron gun of cold field emission type, enabling beam deceleration at ultra-low landing voltages between 100-500 V, which is essential for examining shallow surface topographies without damaging the samples. Additionally, its Energy Dispersive Spectroscopy (EDS) capability, featuring a large area silicon drift detector, enhances the tool's versatility by providing real-time elemental analysis. Users benefit from the instrument's comprehensive training and support, ensuring they can confidently operate the sophisticated technology for precise imaging and materials characterization.
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