Select Instruments

The Thermo Scientific Talos F200X G2 is a 200 kV scanning transmission electron microscope that combines high-resolution STEM and TEM imaging with advanced EDS capabilities. Its features include a high-brightness X-FEG electron source, Super-X EDS detection system, and 4k x 4k Ceta camera for fast imaging. The advantages of this system are its ability to perform rapid, precise 2D and 3D chemical characterization and compositional mapping at the nanoscale. Users benefit from accelerated nano-analysis with higher data quality, faster acquisition, and simplified automated operation for quantitative characterization of nanomaterials across multiple dimensions.

The Helios NanoLab 600i is a state-of-the-art SEM/FIB DualBeam workstation that offers a unique combination of ultra-high resolution imaging and focused ion beam milling capabilities. It features advanced technologies such as a Schottky Field Emission Cathode and a high-resolution ion optics system, enabling sub-nanometer imaging and precise nanoscale milling. Users can benefit from its various imaging modes and detectors, which facilitate detailed analysis and sample preparation for advanced applications, including TEM and atom probe studies. The integrated automation software enhances workflow efficiency, allowing for automated milling and serial sectioning. Overall, the Helios NanoLab 600i empowers researchers with unparalleled capabilities to manipulate and analyze materials at the nanoscale, enhancing their ability to innovate in various fields.

The Hitachi S-4800 High Resolution SEM is a cutting-edge scanning electron microscope offering exceptional imaging capabilities with resolutions as fine as 1.0 nm at 15 kV. Its versatile magnification range from 30x to 800,000x, coupled with a cold field emission electron gun and adjustable accelerating voltage from 0.5 to 30 kV, allows for precise examination of a wide variety of samples up to 4 inches in diameter. The instrument's advanced imaging modes, including beam deceleration for ultra-low landing voltages and controlled signal mixing, enable detailed surface analysis. Researchers benefit from the integrated Oxford Ultim Max 100mm² EDS detector, providing real-time electron and chemical imaging with live tracing features, while the flexible stage movement (110mm in X and Y directions) and tilt (-5° to +70°) capabilities ensure optimal sample positioning for comprehensive analysis.

The Cypher Atomic Force Microscope (AFM) offers a 30 µm x 30 µm lateral scan size and a 5 µm vertical range, with exceptionally low noise levels that enhance data clarity for high-resolution imaging. Its fast scanning capabilities allow users to conduct measurements efficiently in air or liquid environments, making it versatile for a range of sample types. Features like AM-FM viscoelastic mapping and Contact Resonance enable precise material property assessments, while the high-voltage Piezoresponse Force Microscopy (HV-PFM) mode supports advanced piezoelectric material studies. The dual-gain ORCA conductive AFM, with a current measurement range from 4 pA to 10 µA, is ideal for applications that require precise current versus voltage (I-V) measurements, aided by preamplifier gain options of 1 µA/V and 1 nA/V. Additional capabilities, including fast force mapping, temperature control, and enhanced cantilever stability with blueDrive photothermal excitation, provide reliable, high-speed mechanical mapping and accurate force data across various sample types, including soft, adhesive, and conductive materials.

The Hysitron TI-950 TriboIndenter is a high-precision nanomechanical testing instrument that offers exceptional measurement capabilities with a normal displacement range of 50 mm and indentation depths exceeding 5 μm. Its advanced capacitive transducer technology enables ultra-fine load resolution below 1 nN and displacement resolution under 0.02 nm, allowing researchers to conduct detailed material analyses at the nanoscale. The instrument's versatility is demonstrated by its ability to apply normal loads up to 10 mN and lateral loads up to 2 mN, while the high load transducer can exert lateral forces up to 5 N and normal forces up to 2.8 N. With a data acquisition rate of up to 30 kHz and a range of testing modes including nanoindentation, nanoscratch, and SPM imaging, the TI-950 empowers users to efficiently gather comprehensive mechanical property data on a wide variety of materials and sample sizes, including those up to 250 mm x 250 mm.

The Bruker D8 Advance x-ray diffraction (XRD) and x-ray reflectivity (XRR) system is a versatile X-ray diffractometer featuring a vertical theta/theta goniometer with independent rotation of components, enabling precise control over sample analysis. Its advanced detector, the Eiger2 R 500K, boasts a high capacity of 2.5x10^8 photons/sec/mm^2 and multiple operating modes, allowing for exceptional data collection flexibility. The system's TRIO optics offer four easily switchable beam geometries, including high-resolution configurations, making it adaptable to a wide range of sample types and experimental needs. With a heating chamber capable of in-situ XRD up to 1200°C and comprehensive software suite, the D8 Advance supports diverse applications from powder XRD to advanced thin film analysis. These features combine to provide researchers with a powerful, adaptable tool for materials characterization, offering high-quality data acquisition and analysis across multiple XRD and XRR techniques.

The Thermo Fisher Helios 650 Nanolab Scanning Electron Microscope (SEM) and Focused Ion Beam (FIB) system boasts advanced capabilities that cater to a diverse range of scientific applications, including materials science, biological sciences, and geological sciences. It features an accelerating voltage capability of 50V to 30 kV for electrons and 0.5 kV to 30 kV for ions and a range of beam currents from 0.8 picoamperes (pA) to 26 nanoamperes (nA) for electrons and from 0.1 pA to 65 nA for ions. Users benefit from a remarkable resolution of 0.8 nm at 15 kV for electron imaging and 4.0 nm at 30 kV for ion imaging, enabling detailed surface and cross-sectional analyses essential for defect and failure analysis. Furthermore, the system facilitates serial milling, 3D reconstruction, and advanced specimen preparation for Transmission Electron Microscopy (TEM) and Atom Probe Tomography (APT), enhancing research capabilities and allowing for high-resolution characterization of materials. Ultimately, its comprehensive imaging and analytical functions provide researchers with the precision needed to conduct high-quality studies that drive innovation and development in multiple scientific domains.

The Thermo Fisher Nova 200 Nanolab Scanning Electron Microscope/Focussed Ion Beam (SEM/FIB) offers advanced capabilities for surface and cross-section imaging, enabling users to analyze topology, chemistry, and phase contrast with high precision. This instrument boasts an accelerating voltage range of 0.2 to 30 kV for electrons and ions, translating to unparalleled flexibility for various sample types and imaging needs. With a remarkable electron resolution of 1.1 nm at 15 kV and ion resolution of 7 nm at 30 kV, it allows researchers to observe minute details in their samples, essential for cutting-edge material characterization. Additionally, the SEM/FIB is equipped with gas injectors and micromanipulators, empowering users to perform intricate specimen preparation techniques such as Transmission Electron Microscopy (TEM) and Atom Probe Tomography (APT). This fusion of high-resolution imaging and specimen preparation capabilities significantly enhances the user experience, enabling groundbreaking research and development across multiple scientific disciplines.

The Cameca LEAP 5000 HR is a cutting-edge atom probe tomography (APT) tool that provides unparalleled capabilities in 3D chemical analysis down to the nanometer scale, featuring a spot size of less than 3 μm. Operating with a voltage pulsing frequency of up to 250 kHz and laser pulsing frequencies ranging from 50 to 500 kHz, this equipment enables rapid and efficient examination of material phases and semiconductor structures with detection efficiency nearing 52% in reflectron configuration. The versatile specimen temperature range of 20 to 100 K allows for detailed analysis of phase transformations and defect characteristics, making it essential for users engaged in materials science and failure analysis. By reconstructing materials atom by atom, researchers can obtain precise insights into the microstructural complexities of their samples, significantly enhancing the understanding of properties and behaviors at the atomic level. Ultimately, the LEAP 5000 HR empowers users to drive advancements in material development and optimization, ensuring that they remain at the forefront of innovation in their respective fields.

This advanced X-ray Photoelectron Spectroscopy (XPS) instrument is designed for high-precision surface analysis, featuring hemispherical and spherical mirror energy analyzers that ensure exceptional sensitivity and resolution. The automated dual-anode monochromatic X-ray source (Al Ka/Ag La) enables effective analysis of a wide range of materials, while the high-sensitivity Delay Line Detector (DLD) enhances detection capabilities. With a maximum sample size of 34 mm x 75 mm and thickness of 7 mm, it accommodates various sample types. The instrument supports both large area (700 x 300 µm²) and small spot (15 µm to 110 µm) modes for spectroscopy, and it offers imaging XPS capabilities with a spatial resolution down to 1 µm. Additional features include angle-resolved analysis, a gas cluster ion source for efficient surface cleaning, and a temperature-controlled analysis chamber ranging from -100°C to +800°C, making this tool ideal for comprehensive materials characterization.

The Thermo Nicolet iS50 Fourier transform infrared spectrophotometer is a versatile instrument featuring multiple measurement modes, including transmission, reflection, and attenuated total reflection (ATR), capable of analyzing a wide range of sample types. Its FT-Raman module, with a 500 mW 1064 nm laser, ensures robust measurements while minimizing fluorescence interference, making it ideal for studying complex materials. The system supports various accessories like a USB video camera and sampling trays, facilitating quick and efficient sample handling for users. With built-in diamond ATR technology, it enables streamlined analysis of multiple sample forms with minimal setup, saving valuable time in research and testing. By leveraging its advanced capabilities, users can achieve accurate and reliable spectroscopic data, empowering informed decision-making in their scientific endeavors.

The TESCAN MIRA3 Field Emission Gun Scanning Electron Microscope (FEGSEM) is a state-of-the-art imaging tool capable of operating at an accelerating voltage range of 0-30 kV, which provides flexibility in imaging different materials. With a remarkable resolution of 1.2 nm, this microscope utilizes various imaging modes, including high resolution, depth mode, and wide field mode, facilitating detailed observation of sample surfaces, phase contrasts, and chemical compositions. Equipped with secondary electron and backscattered electron detectors, alongside Energy Dispersive Spectroscopy (EDS) and Electron Backscatter Diffraction (EBSD) capabilities, the MIRA3 allows for comprehensive material analysis, making it ideal for advanced materials science and geological research. This apparatus supports large specimens with a maximum height of 145 mm and weight of 8 kg, and its innovative automated imaging features, such as large-scale orientation imaging and image stitching, enhance workflow efficiency. The addition of the Bruker Hysitron PI 89 Picoindenter enables in-situ mechanical testing alongside SEM imaging, allowing users to conduct nanoindentation and other mechanical assessments at temperatures up to 800°C, ultimately leading to deeper insights in material properties and behaviors.