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Thermo Fisher - Helios 650 Nanolab FIB

Thermo Fisher - Helios 650 Nanolab FIB

Turnaround:

Cost10 business days

Description:

The Thermo Fisher Helios 650 is a state-of-the-art Focused Ion Beam (FIB) tool designed for advanced materials characterization. Operating at a voltage range of 5-30 kV and a beam current from 1 picoampere (pA) to 100 nanoamperes (nA), it offers versatility for a wide range of applications. With a remarkable resolution of 5 nanometers at 30 kV, users can achieve precise imaging and analysis of nanoscale structures. The automated multi-axis stage control enhances usability, allowing for intricate sample manipulation and easier navigation. Equipped with a gas injection system for in-situ deposition, it combines high-resolution imaging capabilities with the ability to modify and fabricate nanostructures on samples up to 100 mm in size and 10 mm in thickness, making it an essential tool for researchers and engineers in the field.

Specifications:

FeaturesSpecifications
Tool TypeFocused Ion Beam (FIB)
Accelerating Voltage Electrons50V to 30 kV
Accelerating Voltage Ions0.5 kV to 30 kV
Beam Current Electrons0.8 pA to 26 nA
Beam Current Ions0.1 pA to 65 nA
Electron FilamentSchottky Field Emitter
DetectorsSecondary Electron Imaging, Everhart-Thornley Detector (ETD), Through-the-lens Detector (TLD), Backscattered Electron Imaging (CBS), Scanning Transmission Imaging (STEM), Ion Imaging (ICE)
Resolution SEM0.8 nm @ 15 kV (TLD-SE), 0.9 nm @ 1 kV (TLD-SE)
Resolution Ion
  • 4.0 nm at 30 kV using preferred statistical method
  • 2.5 nm at 30 kV using selective edge method
Gas InjectorsPlatinum, Carbon
MicromanipulatorOmniprobe Autoprobe 200
Included SoftwareAutoFIB, AutoTEM, 3DEDS, EBS3, Slice and View
StageQuorum PP3006 cryostage

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