Tescan - MIRA3 SEM (with Picoindenter)

Description:

The Tescan MIRA3 SEM (Scanning Electron Microscope) with Picoindenter offers remarkable features designed for advanced materials analysis, including a maximum accelerating voltage of 30kV and exceptional resolution down to 1.2nm. This instrument is equipped with various detectors, including Secondary Electron Imaging and Backscattered Electron Detection, which facilitate versatile imaging capabilities across different modes, catering to high-resolution and large field-of-view requirements. Users benefit from the integrated Picoindenter, which enables precise nanomechanical testing with load capabilities of up to 500mN and an impressive maximum displacement of 150µm. The spacious sample chamber, with a maximum specimen height of 145mm, allows for the examination of larger samples, broadening testing possibilities across multiple applications in materials science. Overall, the combination of high-resolution imaging and detailed mechanical characterization makes the MIRA3 SEM an invaluable tool for researchers seeking in-depth insights into material properties and behaviors.