The Neaspec Nano IR-NIM AFM employs advanced Fourier-transform infrared (FTIR) and scattering scanning near-field optical microscopy (SNOM) techniques to deliver exceptional imaging capabilities. It operates within the mid-infrared range of 700 to 2200 cm -1, enabling users to achieve a resolution of just a few tens of nanometers. With a spatial lateral resolution of 20 nm, this tool allows for detailed chemical and topographic characterization of samples in a measurement area of approximately 100 x 100 µm². The mid-IR imaging module enhances functionality by permitting images to be captured at specific wavelengths, highlighting areas of absorption on the sample. Overall, the Nano IR-NIM AFM provides researchers with the ability to conduct high-resolution chemical analysis, facilitating advanced studies in materials science and nanotechnology.
| Features | Specifications |
|---|---|
| Imaging Technique | FTIR/SNOM |
| Mid-IR Range | 700 to 2200 cm -1 |
| Spatial Lateral Resolution | 20 nm |
| Sample Measurement Area | ~100 x 100 µm 2 |
| Imaging Module | Mid-IR imaging module |
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