3 business days
The Kratos Supra+ XPS is a sophisticated photoelectron spectrometer featuring hemispherical and spherical mirror energy analyzers complemented by a high-sensitivity Delay Line Detector (DLD). With an automated dual anode Al Ka/Ag La monochromatic X-ray source operating at 1486.7/2984.2 eV, this tool facilitates precise surface analysis. It supports a maximum sample size of 34 mm x 75 mm and thickness of up to 7 mm, allowing flexibility in sample handling. Users can choose between large area (700 x 300 µm²) and small spot modes (ranging from 110 µm to 15 µm diameters) for diverse spectroscopy needs, achieving a spatial resolution down to 1 µm. Additional features including angle-resolved XPS analysis and a robust gas cluster ion source enhance the tool's versatility, making it ideal for advanced research requiring high-resolution imaging and precise element analysis.
| Features | Specifications |
|---|---|
| Automated dual anode Al Ka/Ag La monochromatic X-ray source | 1486.7/2984.2 eV |
| Maximum sample size | 34 mm x 75 mm |
| Maximum thickness | 7 mm |
| Large area mode | 700 x 300 µm² |
| Small spot mode | 110 µm, 55 µm, 27 µm, 15 µm diameters |
| Imaging XPS fields-of-view | 800 x 800 µm², 400 x 400 µm², 200 x 200 µm² |
| Spatial resolution | 1 µm |
| XPS image-stitching mode | up to 10 x 10 mm² |
| Ar + /Ar n + gas cluster ion source options | Ar + at 50 kV |
| Gas cluster ion source options | Ar 500 + , Ar 1000 + , Ar 2000 + , Ar 3000 + at 5, 10, 15 or 20 kV |
| Analysis chamber heating and cooling | -100°C to +800°C |
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