FEI - Helios 600i Dual Beam FIB

Description:

The FEI Helios 600i Dual Beam SEM/FIB is a sophisticated workstation that combines scanning electron microscopy (SEM) with focused ion beam (FIB) capabilities to achieve ultra-high resolution imaging and precise milling. With a resolution of 1.4 nm at 1 kV and a beam current of up to 65 nA, it enables rapid and detailed nanoscale prototyping and machining. Users benefit from advanced detection technologies, including a high-performance Ion Conversion and Electron detector, ensuring excellent imaging quality and accurate material analysis. The system’s unique features, such as a retractable directional backscattered detector and beam deceleration mode, facilitate versatile sample handling at low landing energies, enhancing sample integrity. Overall, the Helios 600i is designed to meet the rigorous demands of nanotechnology research and development, providing users with powerful tools for innovation and discovery.