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The Cameca LEAP 5000 HR is an advanced atom probe tomography tool that provides detailed atom-by-atom reconstruction of materials, facilitating 3D chemical analysis at the nanometer scale. It features a voltage pulsing frequency of up to 250 kHz and can operate with a laser pulsing frequency between 50 to 500 kHz. The tool's capability to analyze phase transformations and semiconductor properties, particularly dopants and quantum structures, enables researchers to gain deeper insights into material behaviors. With a detection efficiency of approximately 52% in reflectron configuration and a spot size less than 3 micrometers, it ensures high-resolution data collection. Overall, the LEAP 5000 HR empowers users by enhancing their ability to investigate material properties with unparalleled precision, significantly advancing research in materials science and engineering applications.
Features | Specifications |
---|---|
Applications | Materials Science, Geological Sciences, Devices, Defect & Failure Analysis |
Atom by atom reconstruction of materials | 3D chemical analysis at the nanometer scale |
Semiconductor analysis | Dopants, quantum structures |
Voltage pulsing frequency | Up to 250 kHz |
Pulse fraction | <25% |
Laser pulsing wavelength | 355 nm |
Laser pulsing frequency | 50 to 500 kHz |
Spot size | < 3 μm |
Specimen temperature | 20-100 K |
Detection efficiency (reflectron configuration) | ~52% |
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