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The Bruker D8 Advance is a sophisticated X-ray diffraction (XRD) and reflectivity (XRR) system that incorporates a vertical theta/theta goniometer and a high-resolution Eigher2 R 500 K detector with 1,030 x 514 pixels and a pixel size of 75 microns. This tool excels in flexibility, offering multiple configurations, including line focus Bragg Brentano and high-resolution options, making it suitable for a wide range of applications such as powder XRD, thin film analysis, and texture studies. Users benefit from its high photon capacity of 2.5x10^8 photons per second per mm², ensuring rapid data acquisition even for complex samples. Additionally, its ability to operate at temperatures up to 1200 °C with a four-circle sample stage enhances its utility for in situ experiments. Ultimately, the D8 Advance enables precise material characterizations, supports advanced research needs, and streamlines the analysis process with powerful software tools like EVA and TOPAS.
| Features | Specifications |
|---|---|
| Model | D8 Advance |
| Goniometer Type | Vertical theta/theta |
| Detector | Eigher2 R 500 K |
| Pixel Size | 75 microns |
| Total Pixels | 1,030 x 514 |
| Photon Capacity | 2.5x10^8 photons per sec per mm^2 |
| Configurations | Line focus Bragg Brentano, Line focus parallel beam, Line focus high-resolution, Optional point focus |
| Radiation Source | Cu K-alpha or Cu K-alpha1 |
| Heating Chamber Temperature | Up to 1200 °C |
| Sample Stage Type | Four-circle |
| Applications | Powder XRD, Thin film XRD, Grazing incidence XRD, High resolution epitaxial, Single crystal materials, Reciprocal space mapping, Texture and stress analysis, X-ray reflectivity |
| Software | EVA data analysis, TOPAS structure refinement, Leptos software |
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