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Asylum Research - Cypher S AFM

Asylum Research - Cypher S AFM

Turnaround:

Cost3 business days

Description:

The Asylum Research Cypher S is a state-of-the-art Atomic Force Microscope (AFM) that offers a maximum lateral scan size of 30 µm x 30 µm and a maximum vertical range of 5 µm, enabling detailed imaging of samples in either air or liquid environments. With exceptionally low noise levels, it ensures high-resolution measurements, making it ideal for sensitive applications. The instrument is equipped with various advanced scanning modes and accessories, including AM-FM viscoelastic mapping and Contact Resonance viscoelastic mapping, which enhance its versatility for different research needs. A standout feature is the Fast Force Mapping upgrade, which allows users to acquire force curves in just minutes rather than hours, significantly improving data collection efficiency. Ultimately, this combination of high performance and quick data acquisition enhances research capabilities, enabling users to explore previously unscannable soft or adhesive samples with precision.

Specifications:

FeaturesSpecifications
Maximum lateral scan size30 µm x 30 µm
Maximum vertical range5 µm
Scanning modesAir or liquid environments
Noise levelExceptionally low
Fast scanning capabilitiesYes
AccessoriesAM-FM viscoelastic mapping
AccessoriesContact Resonance viscoelastic mapping
AccessoriesHV-PFM (piezoresponse force microscopy)
AccessoriesDroplet cantilever holder
AccessoriesAir Temperature Controller
AccessoriesblueDrive photothermal excitation
AccessoriesScanning Tunneling Microscopy
Conductive AFMYes (dual-gain ORCA)
Current measurement range4pA to 10uA
Fast Force Mapping upgradeYes
Simultaneous mappingTopography, stiffness, and adhesion
Speed enhancement for force curve acquisitionHours -> minutes

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