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The Asylum Research Cypher S is a state-of-the-art Atomic Force Microscope (AFM) that offers a maximum lateral scan size of 30 µm x 30 µm and a maximum vertical range of 5 µm, enabling detailed imaging of samples in either air or liquid environments. With exceptionally low noise levels, it ensures high-resolution measurements, making it ideal for sensitive applications. The instrument is equipped with various advanced scanning modes and accessories, including AM-FM viscoelastic mapping and Contact Resonance viscoelastic mapping, which enhance its versatility for different research needs. A standout feature is the Fast Force Mapping upgrade, which allows users to acquire force curves in just minutes rather than hours, significantly improving data collection efficiency. Ultimately, this combination of high performance and quick data acquisition enhances research capabilities, enabling users to explore previously unscannable soft or adhesive samples with precision.
Features | Specifications |
---|---|
Maximum lateral scan size | 30 µm x 30 µm |
Maximum vertical range | 5 µm |
Scanning modes | Air or liquid environments |
Noise level | Exceptionally low |
Fast scanning capabilities | Yes |
Accessories | AM-FM viscoelastic mapping |
Accessories | Contact Resonance viscoelastic mapping |
Accessories | HV-PFM (piezoresponse force microscopy) |
Accessories | Droplet cantilever holder |
Accessories | Air Temperature Controller |
Accessories | blueDrive photothermal excitation |
Accessories | Scanning Tunneling Microscopy |
Conductive AFM | Yes (dual-gain ORCA) |
Current measurement range | 4pA to 10uA |
Fast Force Mapping upgrade | Yes |
Simultaneous mapping | Topography, stiffness, and adhesion |
Speed enhancement for force curve acquisition | Hours -> minutes |
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